Apparatus and methods for the shunt calibration of semiconductor strain gage bridges
US4414837A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 16, 1982 |
| Grant date | Nov 15, 1983 |
| Priority date | — |
| Expiry date | Feb 16, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R17/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is disclosed an apparatus and a technique for shunt calibration of a Wheatstone bridge array independent of temperature. The structure involves a side completion half bridge array which has two temperature sensitive resistors as semiconductor strain gages forming one arm of the bridge and two temperature insensitive resistors forming the other arm of the bridge. An input voltage is applied to two opposite terminals of the bridge via equal span resistors and an output is taken between the common terminals of each of the bridge arms. A calibration resistor is positioned to shunt a span resistor and a temperature insensitive resistor to provide a calibrated output voltage of a magnitude independent of temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.