Automated radiographic inspection system
US4415980A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 2, 1981 |
| Grant date | Nov 15, 1983 |
| Priority date | — |
| Expiry date | Mar 2, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In an automated real-time radiographic inspection system for detecting flaws, defects or inhomogeneities in manufactured objects, the objects (10, 11, 12, . . . ) to be tested are moved on a conveyor (20) in succession past an X-ray source (30). Penetrating X-ray radiation is transmitted through the objects (10, 11, 12, . . . ) to cause an image to be formed for each object in succession by an electronic imaging system (40). The imaging system (40) generates digital signals representative of the image for each object, and transmits the digital signals to a data processor/comparator (50). One of the objects (10, 11, 12, . . . ) may be considered as a reference object against which the other objects are compared for structural homogeneity. Thus, the electronic images of the objects (11, 12, . . . ) could be compared with the electronic image of, for example, the object (10). Alternatively, the electronic images of the test objects could be compared with an electronic reference image programmed into the data processor/comparator (50), the programmed reference image. The comparison performed by the data processor/comparator (50) is a subtraction process, which eliminates background fea…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.