Apparatus for detecting and measuring defects
US4417149A · kind A · utility
22Cited by
3References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 18, 1981 |
| Grant date | Nov 22, 1983 |
| Priority date | — |
| Expiry date | Sep 18, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for detecting and measuring the area of defects in a sheet or rolled material comprises a defect detection section which rapidly scans the whole area of the material to locate the positions of defects and a defect size measuring section which is moved directly to each of the located positions to measure the area of the defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.