Patent · US Expired

Measuring apparatus

US4417815A · kind A · utility

6Cited by
1References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 8, 1981
Grant dateNov 29, 1983
Priority date
Expiry dateDec 8, 2001

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J9/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus for measuring or detecting changes in a variety of physical or chemical parameters comprises an interferometer having a transmission frequency variable over a range of frequencies as a function of changes in the parameter. The transmission frequency is measured by beating with a coherent reference frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.