Stress-compensated quartz resonators
US4419600A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 27, 1981 |
| Grant date | Dec 6, 1983 |
| Priority date | — |
| Expiry date | May 27, 2001 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03H9/02133
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A stress compensated thickness-shear resonator is of an orientation (yxwl) .phi./.theta. selected from loci of stress compensated orientations provided for both the fast and slow thickness-shear modes of vibration. A stress compensated orientation is used in an oscillator for stable frequency-stress behavior. A stress compensated orientation having large-valued temperature coefficients of frequency is used in a temperature sensor for precision measurements. A stress and temperature compensated orientation is used in a pressure sensor such that the temperature compensated thickness-shear mode is used for pressure measurement while the stress compensated thickness-shear mode is used to compensate for effects of temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.