Positioning measuring apparatus and method
US4425042A · kind A · utility
3Cited by
2References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 8, 1981 |
| Grant date | Jan 10, 1984 |
| Priority date | — |
| Expiry date | Jul 8, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A portion of a collimated light beam is directed at an article, and the resultant shadow-containing beam is reflected by a mirror onto a linear photodiode array. A second portion of the collimated beam is initially reflected by the mirror toward the article. The resultant shadow-containing beam impinges upon a second portion of the diode array. The positions of the two shadows on the array are indicative of the X and Y positions of the article. The scanned output from the array is processed to generate two binary signals representative of the X and Y positions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.