Patent · US Expired

Wafer aligners

US4425075A · kind A · utility

23Cited by
6References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 20, 1981
Grant dateJan 10, 1984
Priority date
Expiry dateApr 20, 2001

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67787
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus for prealigning a silicon wafer prior to transfer to a work station. The wafer is spun on an aligning platform by means of air jets emanating from holes disposed in the surface of the platform while simultaneously being stopped by means of a vacuum source communicating with the surface of the platform. Sensor means detect when the wafer is centered within a first predetermined tolerance to turn off the air jets and vacuum to stop the wafer. Control means responsive to the sensor means then center the wafer to within a second predetermined tolerance. The wafer is then transported to the work station for processing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.