Method and apparatus for noble gas atom detection with isotopic selectivity
US4426576A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 8, 1981 |
| Grant date | Jan 17, 1984 |
| Priority date | — |
| Expiry date | Sep 8, 2001 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0422
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Apparatus and methods of operation are described for determining, with isotopic selectivity, the number of noble gas atoms in a sample. The analysis is conducted within an evacuated chamber which can be isolated by a valve from a vacuum pumping system capable of producing a pressure of 10.sup.-8 Torr. Provision is made to pass pulses of laser beams through the chamber, these pulses having wavelengths appropriate for the resonance ionization of atoms of the noble gas under analysis. A mass filter within the chamber selects ions of a specific isotope of the noble gas, and means are provided to accelerate these selected ions sufficiently for implantation into a target. Specific types of targets are discussed. An electron measuring device produces a signal relatable to the number of ions implanted into the target and thus to the number of atoms of the selected isotope of the noble gas removed from the gas sample. The measurement can be continued until a substantial fraction, or all, of the atoms in the sample have been counted. Furthermore, additional embodiments of the apparatus are described for bunching the atoms of a noble gas for more rapid analysis, and for changing the target fo…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.