Reflection coefficient measurements
US4427936A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 22, 1981 |
| Grant date | Jan 24, 1984 |
| Priority date | — |
| Expiry date | Jun 22, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A compact apparatus for the accurate measurement of complex reflection coefficients and VSWR of a device over a bandwidth of an octave or greater by preferably measuring three power levels at detectors associated with the device. The device is formed by the junction of 5 transmission lines two of which are used for receiving a test signal and for transmitting the signal to the device being measured. The other three transmission lines are connected to detector arms each having a detector associated therewith. The techniques of the invention are embodied herein in a waveguide embodiment, a stripline embodiment and a microstrip embodiment of the invention.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.