Method of measuring time constant using a spectrum analyzer
US4427937A · kind A · utility
3Cited by
1References
4Claims
0Family size
Inventors
Key dates
| Filing date | Sep 25, 1981 |
| Grant date | Jan 24, 1984 |
| Priority date | — |
| Expiry date | Sep 25, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2831
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the time constant of an exponential waveform using a spectrum analyzer. From the different output Fourier components, one can calculate the time constant. This method is suitable for deep level transient spectroscopy for determining the emission rate and activation energy of traps in semiconductors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.