Two layer probe
US4428026A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 20, 1981 |
| Grant date | Jan 24, 1984 |
| Priority date | — |
| Expiry date | Nov 20, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01F23/263
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for the measurement of the level of conductive materials within a conductive vessel is disclosed which is particularly suitable for the measurement of the level of conductive granular materials such as coal or other minerals or plastics or vegetable matter which are conductive. In a preferred embodiment the probe comprises a conductive steel core covered with a layer of insulating plastic and covered further with a layer of a semi-conductive material which preferably comprises a plastic which has been partially filled with a conductive material such as carbon black. Other embodiments wherein the probe may comprise a conductive plate covered by insulation further covered by a similar semi-conductive layer are also disclosed. Reference is made to prior art disclosures of circuitry and theory which enable the use of the probe of the invention.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.