IC with built-in electrical quality control flag
US4428068A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 12, 1981 |
| Grant date | Jan 24, 1984 |
| Priority date | — |
| Expiry date | Nov 12, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated semiconductor circuit device is provided with a special purpose readable indicator without providing additional pins. The indicator may be utilized to store information pertinent to the operativeness of the integrated circuit. The results of quality control monitoring may be written into the store to serve as a flag. A specific application is in semiconductor memory arrays having redundancy memory capability to automatically replace defective memory cells in the primary array. To enable one to know whether or not the redundancy memory array is being used, this information is written into a quality control storage cell. This cell may be a ROM system which may be accessed during a check mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.