Patent · US Expired

System and method for measuring ultrasonic return signals

US4428237A · kind A · utility

31Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 1980
Grant dateJan 31, 1984
Priority date
Expiry dateNov 13, 2000

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/2675
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An ultrasonic return signal analyzing instrument and method including analog circuitry for making partial power measurements on two selected frequency bands of the frequency spectrum of an ultrasonic return signal waveform and digital circuitry for measuring selected features of the envelope of the ultrasonic return signal waveform. Digital waveform measurements are converted to analog signals and then combined in an algorithmic combining circuit to produce a test statistic signal. A decision circuit receives the test statistic signal and registers a decision on a characteristic of the structure under examination based on the value of the test statistic signal. The instrument includes a signal normalization circuit to normalize the ultrasonic return signal to a fixed peak value and includes a frequency up-converter in the normalizing circuit and frequency down-converters in the partial power measurement circuits for increasing the accuracy of peak detection in the normalizing circuit and envelope detection for the partial power band signals and the total power signal. The digital waveform feature measurement circuitry includes circuitry for measuring the rise time and duration time…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.