Portable apparatus for analyzing metals by X-ray fluorescence
US4429409A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 21, 1982 |
| Grant date | Jan 31, 1984 |
| Priority date | — |
| Expiry date | Oct 21, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A portable apparatus for analyzing a sample of material by the X-ray fluorescence method includes a hand-held probe unit connected to an electronic unit. The probe unit includes a radiation source for radiating the material sample and a radiation detector responsive to the X-ray radiation from the material sample for generating a plurality of sample signals representing the elements in the material sample. The probe and electronic units each include a universal asynchronous receiver transmitter for transmitting the sample signals from the probe unit to the electronic unit. The electronic unit includes random access memories for storing the sample signals and a library of groups of signals representing the elements of known materials. A keyboard is provided for adding signals to the library and/or storing the sample signals in the library. A microprocessor and associated circuitry compare the sample signals with the stored groups of signals and generate an identification signal if a match is found. A liquid crystal display and driving circuitry are responsive to the identification signal to generate an indication of the identity of the material sample. Additionally, the apparatus is…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.