Fluorescence laser EXAFS
US4435828A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 1982 |
| Grant date | Mar 6, 1984 |
| Priority date | — |
| Expiry date | Apr 14, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus (10) for obtaining fluorescence laser EXAFS (Extended X-ray Absorption Fine Structure). A lens (12) directs a pulse of radiant energy (13) onto a metal target (15) to produce X-rays (16). A baffle (17) directs the X-rays (16) onto a spectral-dispersive monochromator (18) which directs the spectrally-resolved X-rays (16R) therefrom onto a sample (11). Fluorescence X-rays (27) from the sample (11) strike a phosphor (26) on a grid (19). Emitted light (21) from the phosphor (26) corresponds spatially to the spectral resolution of the X-rays (16R). Emitted light intensity at a point along the spatial distribution corresponds to the absorption characteristics of the sample (11) at a particular wavelength of the incoming X-rays (16R). An imaging lens (20) directs the emitted light (21) onto photographic film or an array detector (22). A reference spectrum of the spectrally-resolved X-rays (16R) is obtained by placing photographic film or an array detector (29) in the path of the spectrally-resolved X-rays (16R) so that only a portion of the X-rays (16R) throughout the spectrum strikes the film or array detector with the remaining portion throughout the spectrum allowed to pass t…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.