Patent · US Expired

Measuring apparatus for the analytical determination of a gas partial pressure

US4444645A · kind A · utility

1Cited by
5References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 12, 1982
Grant dateApr 24, 1984
Priority date
Expiry dateJul 12, 2002

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/4163
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The measuring apparatus is based on an electrochemical sensor with a hollow chamber connected upstream through which the gas to be measured diffuses to the sensor surface. A pump for introducing a rinsing gas is connected to the hollow chamber. Moreover, the rinsing gas connection is connected to a test gas source which produces a known concentration of the component to be measured. The function of the sensor may be controlled by connecting the test gas source. The accuracy of the measured values and thus the reliability of the measuring apparatus may be substantially improved by these measures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.