Versatile focusing radiation analyzer
US4446568A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 5, 1981 |
| Grant date | May 1, 1984 |
| Priority date | — |
| Expiry date | Jun 5, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A versatile focusing radiation analyzer for EXAFS, fluorescence EXAFS, Raman or modified Compton scattering, diffraction, Rayleigh scattering and other experiments is comprised of a concave focusing element (10) placed at the end of a central arm (11) pivoted at the center (24) of a circle (21). Side arms (12, 13) are also pivoted at the center (24). A platform (17) supports an X-ray source (50, 61, 66) or a sample (16) at the end of one side arm (12) while a platform (23) supports a detector (22, 63, 66), sample (51) and detector (52) or Mossbauer source (80). Constraining bars (14, 15) attached to the side arms and to a slide (29) in a slot (30) cause one side arm (13) to maintain an angle (.theta.) with the center arm equal to the angle of the other side arm (12) with the center arm as the center arm is driven relative to that side arm by suitable means (25-28). Rods (31, 32) or belts (36, 38) with pulleys (35, 37) maintain the optical axis of the elements on the platforms (17, 23) directed to the center of the focusing element (10) as the angle (.theta.) is varied. The focusing element (10) may be a single crystal bent and polished to a Johanssen focusing configuration, or a sa…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.