Charged particle sensor
US4447145A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 1982 |
| Grant date | May 8, 1984 |
| Priority date | — |
| Expiry date | Apr 30, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G15/0855
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus in which the developability of electrostatically charged particles in a mixture of particulate material is measured. The apparatus includes a pair of spaced-apart conductive plates through which at least a portion of the particulate mixture flows. One of the plates is transparent with a member being secured thereto. The transparent plate is electrically biased to attract charged particles thereto. A beam of energy is transmitted through the transparent plate and member. The intensity of the internally reflected beam is detected to provide a measurement of the quantity of charged particles adhering to the transparent plate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.