Patent · US Expired

Sputtering apparatus and methods

US4450062A · kind A · utility

16Cited by
2References
1Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 5, 1983
Grant dateMay 22, 1984
Priority date
Expiry dateAug 5, 2003

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/022
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of depositing material onto an object in an ionization chamber having a shutter therein which has an object-obscuring portion comprising the step of confining particles of matter deposited on the object-obscuring portion of the shutter to such object-obscuring portion while the object is being deposited with material. The object-obscuring portion of the shutter includes an open ended container, the open end thereof being formed in an upper portion of the shutter. During ionization a glow region is formed in the chamber separated from a source of the material by a dark space region. The upper surface of the shutter is disposed in the dark space region and the bottom of the container is separated from the source sufficiently to enable ionization. Prior to deposition of the material onto the object, the object-obscuring portion of the shutter is positioned between a source of the material and the object and contaminents on the surface of such source are removed therefrom and are collected within the container. After this cleaning process, the object-obscuring portion of the shutter is removed from between the source and the object to allow deposition of the material onto the …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.