Electron microscope comprising an X-ray detector
US4450355A · kind A · utility
3Cited by
1References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 26, 1981 |
| Grant date | May 22, 1984 |
| Priority date | — |
| Expiry date | Oct 26, 2001 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/24585
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A detector for measuring X-rays in an electron microscope comprises a shield which shields a detector entrance window against the incidence of electrons or not in accordance with the various measuring settings. The shield may be arranged to be movable under the influence of the magnetic field strength variation which occurs during the switching over between the various measuring settings.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.