Patent · US Expired

Nonvolatile semiconductor memory device

US4453234A · kind A · utility

10Cited by
3References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 16, 1981
Grant dateJun 5, 1984
Priority date
Expiry dateSep 16, 2001

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/683
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A nonvolatile semiconductor memory device having floating gate type field effect transistors with floating gate electrodes. In the memory device, a source region, an active region and a drain region are formed in a first semiconductor region. A second semiconductor region is formed so as to electrically be insulated from the first semiconductor region. A floating gate electrode is formed on the first and second semiconductor regions with an insulating film interposed therebetween, respectively. The floating gate electrode faces the second semiconductor region with the insulating film interposed therebetween so that charge may be transferred between the floating gate electrode and second semiconductor region in order to control an amount of charge in the floating gate electrode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.