Optical distortion analyzer system
US4453827A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Aug 28, 1981 |
| Grant date | Jun 12, 1984 |
| Priority date | — |
| Expiry date | Aug 28, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/9586
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical distortion analyzer system which is capable of automatically quantifying with a high degree of accuracy and repeatability the optical quality of transparencies such as windshields or windows. The analyzer system is made up of a platform adapted to support the transparency with two degrees of freedom. A probe beam of electromagnetic radiation emanating from, for example, a laser is passed through the transparency as the transparency is moved about a horizontal and vertical axis establishing a plurality of test points on the transparency. An analyzer unit receives the probe beam and therefrom establishes horizontal and vertical deviations in the transparency as well as determining the cylindrical and spherical lens power components and principal meridan angle of the transparency. A processor provides recognizable opthalmic parameters of the above characteristics of the transparency and correlates these parameters with the plurality of test points on the transparency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.