Apparatus for sensing test values at test samples

US4455755A · kind A · utility

Assignee

• Ernst Leitz Wetzlar, GmbH · DE

Inventors

• Rainer Fritsche · Wetzlar, DE
• Hans-Dieter Jacoby
• Erich Schuster · Gammertingen, DE

Key dates

• Filing date: Sep 14, 1982
• Grant date: Jun 26, 1984
• Expiry date: Sep 14, 2002

Classification

• Technology area (CPC G): Physics
• CPC primary: G01P15/093
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Apparatus for sensing test values at test samples which uses an elastically supported mechanical sensor (3) moving relative to test samples (4) and at least one test value transmitter (11) with counter (9) detecting the relative motion between the sensor (3) and the test samples. At the instant of impact between sensor (3) and the test samples (4), a signal is generated which is used to store the test value present at the test value transmitter (11) at the instant of impact between the sensor (3) and the test samples (4) into a memory (13a,13b). The sensor consists of one part (2') which is fixed to the housing and other part (2") which is movable with respect to the fixed one. An oscillation or acceleration pickup (10) is mounted externally to the moving part (3) and generates the signal required to store the test value. A circuit (14) is provided to the oscillation or acceleration pickup (10) to distinguish between actual sensing signals and spurious ones. This circuit (14) selects any spurious signals from the sensed (test) signal and controls the data flow between the memory (13a,13b) and a subsequent computer (16) for analyzing the test signals.