Patent · US Expired

Apparatus for gas-assisted, solid-to-solid thermal transfer with a semiconductor wafer

US4457359A · kind A · utility

134Cited by
3References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 25, 1982
Grant dateJul 3, 1984
Priority date
Expiry dateMay 25, 2002

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68735
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Apparatus and method are provided for effecting gas-assisted, solid-to-solid thermal transfer with a semiconductor wafer. A semiconductor wafer is loaded at its periphery onto a shaped platen. Sufficient contact pressure from the loading is produced between the wafer and the platen so that significant gas pressure may be accommodated against the back side of the wafer without having the wafer bow outwardly or break. Gas under pressure is introduced into the microscopic void region between the platen and the wafer. The gas fills the microscopic voids between the platen and semiconductor wafer. The gas pressure approaches that of the preloading contact pressure without any appreciable increase in the wafer-to-platen spacing. Since the gas pressure is significantly increased without any increase in the wafer-to-platen gap, the thermal resistance is reduced and solid-to-solid thermal transfer with gas assistance produces optimum results.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.