Patent · US Expired

Process for the luminescense-spectroscopic examination of coatings and coating profiles

US4460274A · kind A · utility

11Cited by

4References

7Claims

0Family size

Assignee

Agfa-Gevaert NV · BE

Inventors

Hans-Joachim Schumann · Neunburg vorm Wald, DE
Manfred Faust · Bensberg, DE

Key dates

Filing date	Oct 9, 1981
Grant date	Jul 17, 1984
Priority date	—
Expiry date	Oct 9, 2001

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/0658
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a process for luminescence-spectroscopic examination and determination of coatings and coating profiles of solid and liquid layers and layer assembles whereby the luminescent substances present in the layers are photoselectively probed and determined through emission product spectra in incident and/or transmitted light by a photon detector using an emission spectroscopic process and whereby the photoselectivity of the luminescence-spectroscopic process being based on the substance related choice of the difference in wavelength .DELTA. .lambda. between the emission wavelength .lambda..sub.e and the excitation wavelength .lambda..sub.a.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.