Patent · US Expired

Integrated circuit test socket

US4461525A · kind A · utility

35Cited by
3References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 17, 1982
Grant dateJul 24, 1984
Priority date
Expiry dateAug 17, 2002

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01R13/62
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A test socket which is for an integrated circuit device and which includes clamp wings pivotally mounted to the socket frame side faces. Each clamp wing includes conductive biased leads terminating in contacts which overlie and contact the leads of the integrated circuit device, serving to retain the device within the socket frame while completing an electrical circuit between a printed circuit board and the integrated circuit device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.