Temperature compensated measuring system
US4464725A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 6, 1983 |
| Grant date | Aug 7, 1984 |
| Priority date | — |
| Expiry date | Oct 6, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01G21/244
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature-compensated measuring system employs an internal signal-processor to provide high accuracy measurements, correct over a wide range of temperatures. In a calibration mode, the system employs the signal-processor to provide mathematical constants used to generate a temperature-compensation function. In a measurement mode, signals representing the uncompensated quantity and the system temperature are supplied to the signal-processor, which uses them to generate a temperature-compensation function from which it produces a high-accuracy temperature-corrected value of the measured quantity. In various forms, the invention can be used to measure temperature-compensated force, pressure or acceleration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.