DC characteristics measuring system
US4467275A · kind A · utility
14Cited by
3References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 15, 1982 |
| Grant date | Aug 21, 1984 |
| Priority date | — |
| Expiry date | Oct 15, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2601
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A novel digitized measuring system is disclosed for the measurement of the DC parameters of a wide variety of electrical and electronic devices. A stimulus measuring unit (SMU) is disclosed which can alternatively act as a voltage source and current monitor or as a current source and voltage monitor. A device under test (DUT) can be characterized without changing external connections and the resulting data can be manipulated and displayed in a wide variety of graphical or tabular forms.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.