Multi frequency eddy current test apparatus with intermediate frequency processing
US4467281A · kind A · utility
67Cited by
4References
12Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 29, 1980 |
| Grant date | Aug 21, 1984 |
| Priority date | — |
| Expiry date | Feb 29, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An eddy current test apparatus and method in which multiple sequential test frequencies are employed. The voltage induced in a sensing coil at said test frequencies are multiplexed and frequency translated to provide a single frequency for processing. The apparatus employs a single channel to process the induced voltages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.