X-ray detector with compensating secondary chamber
US4469947A · kind A · utility
4Cited by
7References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 2, 1982 |
| Grant date | Sep 4, 1984 |
| Priority date | — |
| Expiry date | Apr 2, 2002 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J47/02
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention relates to an X-ray detector adapted to detect rays having passed through an object or an organ. This detector comprises at least one main tight chamber containing a gas ionizable by X-ray and, in this chamber, a plate for collecting the charges resulting from ionization of the gas. It comprises a secondary ionization chamber, coupled to the main chamber to compensate the scattering current.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.