Multi-sample particle analysis apparatus and method
US4471297A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 27, 1982 |
| Grant date | Sep 11, 1984 |
| Priority date | — |
| Expiry date | Sep 27, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/131
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A suction chamber and at least one sample chamber are located in relatively shiftable operating adjacency. The suction chamber may have a plurality of orifices and the sample chamber a single port for selective registration with the orifices. On the other hand, the suction chamber may have a port or an orifice, and a plurality of sample chambers may have either respective ports or orifices, and the chambers mounted for relative shifting for effecting selective port/orifice registration. A sample depletion detector may be provided in association with the sample chamber. The sample chamber may have a minimum volume residual sample well for maintaining a filled system with the suction chamber to facilitate recurrent sample analyzing function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.