Process of fabricating target for calibrating and testing infrared detection devices
US4480372A · kind A · utility
9Cited by
10References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 25, 1983 |
| Grant date | Nov 6, 1984 |
| Priority date | — |
| Expiry date | Apr 25, 2003 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49888
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Apparatus for calibrating and testing infrared detection devices is provided. The apparatus comprises a substrate which supports a target pattern of dielectric material which is at least partially absorbing to infrared radiation. A heater is used to supply heat to the substrate. Since the substrate and dielectric material have different emissivities, an apparent temperature difference is perceived by an IR detection device. As a consequence, temperature differences as low as about 0.02.degree. C. and below can be generated for calibrating and testing IR imaging devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.