Apparatus and method for measuring electronic response of high speed devices and materials
US4482863A · kind A · utility
32Cited by
3References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 14, 1981 |
| Grant date | Nov 13, 1984 |
| Priority date | — |
| Expiry date | Aug 14, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/308
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Direct measurements of electronic device and material response times are made by using high speed photoconductors as both pulse generators and sampling gates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.