Method and apparatus for determining the location of graduated marks in measuring applications
US4484071A · kind A · utility
Inventors
Key dates
| Filing date | Mar 12, 1982 |
| Grant date | Nov 20, 1984 |
| Priority date | — |
| Expiry date | Mar 12, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for determining the location of graduated marks in measuring comprising source means for emitting electromagnetic radiation towards electromagnetic radiation sensors, and a measuring mark moveable between the source means and the sensors from one measuring position to another in a direction of measurement transverse to the direction of radiation, the mark being adapted to cause a restriction in the cross-sectional measurement of radiation between the source means and the sensors, the sensors being adapted to detect the location of the radiation restriction by sensing radiation intensity proportional to the area of their receiving faces upon which such radiation falls in use.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.