Test set for transient protection devices
US4484136A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 25, 1981 |
| Grant date | Nov 20, 1984 |
| Priority date | — |
| Expiry date | Jun 25, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and device for testing transient protection circuits comprising itive and negative high voltage protection circuits and high voltage fast rise time protection circuits. A bipolar test signal with alternate positive and negative high voltage pulses is applied to the circuit under test. Determination is made whether the pulses are within a predetermined voltage window. Signals indicating pass/fail responsive to that determination are generated. A high voltage fast rise time negative pulse is applied to the circuit under test. Changes in the voltage-time waveform are sensed and compared to predetermined levels. Pass/fail signals are generated in response to the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.