Testing an integrated circuit containing a tristate driver and a control signal generating network therefor
US4490673A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 26, 1982 |
| Grant date | Dec 25, 1984 |
| Priority date | — |
| Expiry date | May 26, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/316
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit chip includes a tristate driver which assumes an active logical state in response to a data signal at its data input and assumes a high impedance state in response to a control signal at its control input. The integrated circuit chip also includes a control signal generating network which is connected to the tristate driver's control input for producing the control signal. The control signal generating network may be tested by connecting the control signal generating network to the data input and overriding the control input to prevent the tristate driver from assuming the high impedance state. Thus, for testing purposes, the proper response of the control signal generating circuit may be ascertained by monitoring the active state of the tristate driver.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.