Patent · US Expired

Process for forming microcrystalline silicon material and product

US4492736A · kind A · utility

15Cited by
0References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 29, 1983
Grant dateJan 8, 1985
Priority date
Expiry dateSep 29, 2003

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0262
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for forming microcrystalline silicon material includes the steps of introducing a silicon-containing gas, hydrogen gas and a relatively inert gas into a work environment to form a preselected gas atmosphere, and establishing a glow discharge through the gas atmosphere. A microcrystalline thin film of silicon is formed on a substrate exposed to the discharge. In a preferred embodiment, the power level of the discharge is less than 0.08 watts per square centimeter and the film is deposited at a rate of no more than approximately two angstroms per second. Under these circumstances, the material deposited on the substrate is bombarded by ions of the relatively inert gas, causing the material to form a microcrystalline thin film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.