Patent · US Expired

Test vector indexing method and apparatus

US4493045A · kind A · utility

23Cited by
9References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 19, 1981
Grant dateJan 8, 1985
Priority date—
Expiry dateOct 19, 2001

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31921
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A data channel for a digital tester includes a random access local memory containing a main vector sequence, a subroutine vector sequence, and a test vector list. An index register is loaded with the address of the first vector in the list of vectors that is to be inserted as a variable into a vector stream. A sequence instruction selects the index register as the source of a test vector address when a variable vector is to be inserted into the vector stream at a point in a subroutine. The sequence instruction also resets the index register to a state which determines the address of the next variable to be inserted into the test vector pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.