Processes for the remote measurement of the emissivity and/or the true temperature of a body with relatively smooth surface
US4498765A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 23, 1982 |
| Grant date | Feb 12, 1985 |
| Priority date | — |
| Expiry date | Jun 23, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/58
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process for the remote measurement of the emissivity .epsilon. of a body (1) with relatively smooth surface, consisting: in making, with a detector (6) and a converter (9), a first measurement A of the luminance at a point M on the surface at an emission angle .theta., the thermal radiation (2) on which the measurement is made being polarized (at 4) in a first direction with respect to the emission plane, in making a second measurement B of the luminance at the same point and at the same emission angle .theta., the thermal radiation being polarized in a second direction, different from the first one, finally, in determining the emissivity ##EQU1## .theta..sub.1 being the angle of the axis of the polarizer for A and .theta..sub.2 being the angle of the axis of the polarizer for B, measured with respect to a polarization perpendicular to the emission plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.