Method of manufacturing capacitance-type material level indicator probe
US4499641A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 20, 1982 |
| Grant date | Feb 19, 1985 |
| Priority date | — |
| Expiry date | Sep 20, 2002 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/4922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A capacitance probe and method of probe manufacture for material level sensing systems and like applications. The probe includes a probe rod, a tubular guard coaxially surrounding the rod intermediate the rod ends, and insulation material formed as an integral piece in an injection molding operation surrounding the rod between the rod and guard and also surrounding and radially overlapping axially spaced ends of the tubular guard. One end of the rod and a portion of the guard intermediate its ends are exposed through the insulation material. The molded assembly is captured within a nipple or the like for mounting to a material vessel such that the exposed surfaces of the rod and guard are disposed internally of the vessel for capacitance coupling to material therewithin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.