Infrared microscope inspection apparatus
US4501966A · kind A · utility
5Cited by
1References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 13, 1981 |
| Grant date | Feb 26, 1985 |
| Priority date | — |
| Expiry date | Mar 13, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3568
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.