Patent · US Expired

Electronic device handler

US4506213A · kind A · utility

14Cited by
3References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 18, 1983
Grant dateMar 19, 1985
Priority date
Expiry dateJul 18, 2003

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2851
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A plurality of shuttle means receive untested devices from a feed track and position the devices in electrical contact with a contactor for testing. The shuttle means also discard tested devices via an exit track. Each shuttle means has a test track and a by-pass track. When all the shuttle means are in a load position, each track acts as a segment in a continuous track between the feed track and the exit track. When all the shuttle means are in a test position, each by-pass track acts as a segment in a continuous track between the feed track and the exit track. As long as each shuttle is either in its load position or test position, there is a continuous track between the feed track and the exit track, the segments of the track comprising either by-pass tracks, test tracks or any combination thereof. Defective devices can be pulled from test and discarded while others are undergoing testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.