Patent · US Expired

Low profile IC test clip

US4508403A · kind A · utility

38Cited by
5References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 21, 1983
Grant dateApr 2, 1985
Priority date
Expiry dateNov 21, 2003

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S439/912
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A novel low profile IC test clip for removable attachment to a DIP IC having substantially fixed contacts for sliding engagement with the IC pins, locking means at the ends, which are uncoupled to the contacts, and a laterally extending multi-conductor cable internally connected to the contacts.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.