Coincidence correction in particle analysis system
US4510438A · kind A · utility
16Cited by
21References
29Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 16, 1982 |
| Grant date | Apr 9, 1985 |
| Priority date | — |
| Expiry date | Feb 16, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/1459
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Flat beam optical sensing performed transverse of a flow aperture, of the particles passing through the aperture, directly indicates the presence of individual particles in the aperture. The indication can be used to eliminate or otherwise modulate the coincidence errors resulting in particle measurements taken through the length of the aperture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.