Protective circuit for electronic test probes
US4510482A · kind A · utility
5Cited by
11References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 15, 1982 |
| Grant date | Apr 9, 1985 |
| Priority date | — |
| Expiry date | Dec 15, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/223
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A resistor device comprises a first film of resistive material deposited on a dielectric substrate and having two terminal portions for connection to an electrical circuit, and a second film of resistive material deposited on the substrate in thermally-conductive contact with the first film and electrically isolated therefrom. The material of one of the films has a relatively high temperature coefficient of resistance, so that the resistance of that film can be utilized as an indication of the temperature of the other film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.