Phasor processing of induction logs including skin effect correction
US4513376A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 12, 1982 |
| Grant date | Apr 23, 1985 |
| Priority date | — |
| Expiry date | Jan 12, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for processing induction measurements of sub-surface formations taken by an induction logging system at various depths in a borehole is disclosed. The method reduces the effects of variations in the sonde response function with formation conductivity (skin effect). A filtering function is applied to the quadrature-phase X component measurement of each log measurement to obtain a correction component measurement representative of the change in the sonde response function as a function of formation conductivity. The correction component measurements are then summed with the in-phase R components to obtain a skin effect compensated log.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.