Current probe signal processing circuit employing sample and hold technique to locate circuit faults
US4517511A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jul 13, 1984 |
| Grant date | May 14, 1985 |
| Priority date | — |
| Expiry date | Jul 13, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
During the in-circuit testing of electronic components, stimulus pulses are applied to a circuit bus producing an improper output signal, and the response of the circuit at various nodes connected to the bus is sensed with a current probe. An output signal from the current probe that is indicative of the magnitude and relative direction of the sensed current is sampled during each of the stimulus pulses to thereby isolate the portion of the output signal relating to the pulses from any noise in the circuit being tested. The sampled signal is further integrated to provide an additional measure of isolation, so that the probe signal processing circuit is relatively insensitive to both constant, high frequency noise and random, irregular or low frequency noise components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.