Sensor test circuit of an alarm system
US4518952A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 29, 1983 |
| Grant date | May 21, 1985 |
| Priority date | — |
| Expiry date | Aug 29, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG08B29/14
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
When a receiver supplies both an address signal and a test instruction signal to a given terminal unit, a test voltage generator forming a sensor test circuit of this terminal unit supplies a predetermined test voltage to a corresponding sensor. This sensor generates an analog signal obtained by superimposing the test voltage on the normally detected voltage. The analog signal is A/D-converted, and a resultant digital signal is received by the receiver, thereby allowing a test for operating conditions of any sensor at the site of the receiver. The test voltage generator may generate a plurality of stepwise voltage components to readily check operating characteristics (e.g., overload characteristic) of the sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.