Memory core testing system
US4519076A · kind A · utility
16Cited by
10References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 28, 1981 |
| Grant date | May 21, 1985 |
| Priority date | — |
| Expiry date | Dec 28, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A means for testing the threshold voltage changes in a programmable and erasable floating gate memory cell by accessing directly and exclusively the cells in the core, and the amplifiers that sense the operation of the cells, so as to measure the relative currents therein as an indication of threshold voltage parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.