Testable time delay
US4519090A · kind A · utility
10Cited by
8References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 27, 1982 |
| Grant date | May 21, 1985 |
| Priority date | — |
| Expiry date | Jul 27, 2002 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K5/135
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A testable time delay apparatus includes means for testing component operation during any stage of system function and means for continuously monitoring and testing component functions. The device is particularly useful in critical process control applications such as in a nuclear reactor control system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.